Soft X-Ray Emission and Resonant Inelastic X-Ray Scattering Studies of Transition Metal Oxides

Kevin E. Smith; Cormac McGuinness; James Downes; Philip Ryan; Dongfeng Fu; Steven L. Hulbert; J. M. Honig; Russel Egdell

Soft X-Ray Emission and Resonant Inelastic X-Ray Scattering Studies of Transition Metal Oxides

Kevin E. Smith^*, Cormac McGuinness, James Downes, Philip Ryan, Dongfeng Fu, Steven L. Hulbert, J. M. Honig, Russel Egdell

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

This paper discusses the application of soft x-ray emission and resonant inelastic x-ray scattering as probes of the electronic structure of transition metal oxides. The results of studies on the narrow gap insulator CdO, and the Mott-Hubbard oxide Cr-doped V₂O₃, are reported. The O 2p valence band partial density of states for CdO has been measured, and emission due to the hybridization of the O 2p valence band states with Cd 4d shallow core level has been observed. For Cr-doped V₂O₃, the temperature induced metal-insulator transition in samples with 1.5% Cr was observed using soft x-ray emission, and both charge transfer and dipole forbidden d-d excitations were observed using resonant inelastic x-ray scattering.

Original language	English
Pages (from-to)	3-12
Number of pages	10
Journal	Materials Research Society Symposium - Proceedings
Volume	755
Publication status	Published - 2003
Externally published	Yes

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title = "Soft X-Ray Emission and Resonant Inelastic X-Ray Scattering Studies of Transition Metal Oxides",

abstract = "This paper discusses the application of soft x-ray emission and resonant inelastic x-ray scattering as probes of the electronic structure of transition metal oxides. The results of studies on the narrow gap insulator CdO, and the Mott-Hubbard oxide Cr-doped V2O3, are reported. The O 2p valence band partial density of states for CdO has been measured, and emission due to the hybridization of the O 2p valence band states with Cd 4d shallow core level has been observed. For Cr-doped V2O3, the temperature induced metal-insulator transition in samples with 1.5% Cr was observed using soft x-ray emission, and both charge transfer and dipole forbidden d-d excitations were observed using resonant inelastic x-ray scattering.",

author = "Smith, {Kevin E.} and Cormac McGuinness and James Downes and Philip Ryan and Dongfeng Fu and Hulbert, {Steven L.} and Honig, {J. M.} and Russel Egdell",

year = "2003",

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volume = "755",

pages = "3--12",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

publisher = "Materials Research Society",

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Soft X-Ray Emission and Resonant Inelastic X-Ray Scattering Studies of Transition Metal Oxides. / Smith, Kevin E.; McGuinness, Cormac; Downes, James; Ryan, Philip; Fu, Dongfeng; Hulbert, Steven L.; Honig, J. M.; Egdell, Russel.

In: Materials Research Society Symposium - Proceedings, Vol. 755, 2003, p. 3-12.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Soft X-Ray Emission and Resonant Inelastic X-Ray Scattering Studies of Transition Metal Oxides

AU - Smith, Kevin E.

AU - McGuinness, Cormac

AU - Downes, James

AU - Ryan, Philip

AU - Fu, Dongfeng

AU - Hulbert, Steven L.

AU - Honig, J. M.

AU - Egdell, Russel

PY - 2003

Y1 - 2003

N2 - This paper discusses the application of soft x-ray emission and resonant inelastic x-ray scattering as probes of the electronic structure of transition metal oxides. The results of studies on the narrow gap insulator CdO, and the Mott-Hubbard oxide Cr-doped V2O3, are reported. The O 2p valence band partial density of states for CdO has been measured, and emission due to the hybridization of the O 2p valence band states with Cd 4d shallow core level has been observed. For Cr-doped V2O3, the temperature induced metal-insulator transition in samples with 1.5% Cr was observed using soft x-ray emission, and both charge transfer and dipole forbidden d-d excitations were observed using resonant inelastic x-ray scattering.

AB - This paper discusses the application of soft x-ray emission and resonant inelastic x-ray scattering as probes of the electronic structure of transition metal oxides. The results of studies on the narrow gap insulator CdO, and the Mott-Hubbard oxide Cr-doped V2O3, are reported. The O 2p valence band partial density of states for CdO has been measured, and emission due to the hybridization of the O 2p valence band states with Cd 4d shallow core level has been observed. For Cr-doped V2O3, the temperature induced metal-insulator transition in samples with 1.5% Cr was observed using soft x-ray emission, and both charge transfer and dipole forbidden d-d excitations were observed using resonant inelastic x-ray scattering.

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VL - 755

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JO - Materials Research Society Symposium - Proceedings

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SN - 0272-9172

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