Soft X-Ray Emission and Resonant Inelastic X-Ray Scattering Studies of Transition Metal Oxides

Kevin E. Smith*, Cormac McGuinness, James Downes, Philip Ryan, Dongfeng Fu, Steven L. Hulbert, J. M. Honig, Russel Egdell

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

This paper discusses the application of soft x-ray emission and resonant inelastic x-ray scattering as probes of the electronic structure of transition metal oxides. The results of studies on the narrow gap insulator CdO, and the Mott-Hubbard oxide Cr-doped V2O3, are reported. The O 2p valence band partial density of states for CdO has been measured, and emission due to the hybridization of the O 2p valence band states with Cd 4d shallow core level has been observed. For Cr-doped V2O3, the temperature induced metal-insulator transition in samples with 1.5% Cr was observed using soft x-ray emission, and both charge transfer and dipole forbidden d-d excitations were observed using resonant inelastic x-ray scattering.

Original languageEnglish
Pages (from-to)3-12
Number of pages10
JournalMaterials Research Society Symposium - Proceedings
Volume755
Publication statusPublished - 2003
Externally publishedYes

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