Solution to the bistability problem in shear force distance regulation encountered in scanning force and near-field optical microscopes

A. V. Zvyagin*, J. D. White, M. Kourogi, M. Kozuma, M. Ohtsu

*Corresponding author for this work

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

The bistability problem, common to scanning microscopes employing lateral dithering of the probe for image formation (i.e., shear force microscope) or probe-sample distance control (i.e., near-field optical microscope) is shown to stem from the two nearly degenerate vibration degrees of freedom possessed by a laterally dithered fiber. Controlling the fiber vibration direction by means of a four-sectioned piezo was found to be a simple and effective solution of the problem. An image of a microtubule is presented to demonstrate the improved imaging ability.

Original languageEnglish
Pages (from-to)2541-2543
Number of pages3
JournalApplied Physics Letters
Volume71
Issue number17
Publication statusPublished - 27 Oct 1997
Externally publishedYes

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