Sparse aperture masking (SAM) at NAOS/CONICA on the VLT

Peter Tuthill*, Sylvestre Lacour, Paola Amico, Michael Ireland, Barnaby Norris, Paul Stewart, Tom Evans, Adam Kraus, Christopher Lidman, Emanuela Pompei, Nicholas Kornweibel

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

34 Citations (Scopus)

Abstract

The new operational mode of aperture masking interferometry has been added to the CONICA camera which lies downstream of the Adaptive Optics (AO) corrected focus provided by NAOS on the VLT-UT4 telescope. Masking has been shown to deliver superior PSF calibration, rejection of atmospheric noise and robust recovery of phase information through the use of closure phases. Over the resolution range from about half to several resolution elements, masking interferometry is presently unsurpassed in delivering high fidelity imaging and direct detection of faint companions. Here we present results from commissioning data using this powerful new operational mode, and discuss the utility for masking in a variety of scientific contexts. Of particular interest is the combination of the CONICA polarimetry capabilities together with SAM mode operation, which has revealed structures never seen before in the immediate circumstellar environments of dusty evolved stars.

Original languageEnglish
Title of host publicationGround-Based and Airborne Instrumentation for Astronomy III
Place of PublicationWashington, DC
PublisherSPIE
Pages1-11
Number of pages11
Volume7735
EditionPART 1
ISBN (Print)9780819482259
DOIs
Publication statusPublished - 2010
Externally publishedYes
EventGround-Based and Airborne Instrumentation for Astronomy III - San Diego, CA, United States
Duration: 27 Jun 20102 Jul 2010

Other

OtherGround-Based and Airborne Instrumentation for Astronomy III
Country/TerritoryUnited States
CitySan Diego, CA
Period27/06/102/07/10

Keywords

  • Adaptive Optics
  • Aperture Masking
  • High Contrast Companions
  • Optical Interfereometric Polarimetry
  • Optical Interferometry

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