Abstract
The small size of ferroelectric domain walls (FEDWs) presents a significant challenge for the accurate determination of their electrical properties. Quantification of their specific conductivity (σ), however, is essential for their implementation as functional elements and interconnects in nanoelectronic circuits. Here, we propose a scanning-probe-based method to directly determine the specific conductivity of a single FEDW in an insulating ferroelectric. The method eliminates complications due to size, current magnitude, and non-Ohmic electrical contacts. Transmission line spectroscopy measurements coupled with mean-field theory are able to provide quantitative insight into domain wall conductivity, shown here for prototypical 71° FEDWs in BiFeO3. These results provide significant insight into FEDWs, bringing applications in future nanoelectronic devices a step closer.
[Graphic presents]
| Original language | English |
|---|---|
| Pages (from-to) | 2739-2746 |
| Number of pages | 8 |
| Journal | ACS Applied Electronic Materials |
| Volume | 4 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 28 Jun 2022 |
| Externally published | Yes |
Keywords
- ferroelectrics
- domain walls
- scanning probe microscopy
- specific conductivity
- transmission line spectroscopy
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