Stability issues of Z+Z or Y+Y type cascade system

Liu Fangcheng, Liu Jinjun, Zhang Haodong, Xue Danhong, Hasan Saad Ul, Zhou Linyuan

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

3 Citations (Scopus)

Abstract

The stability issues of cascade systems have been studied for many years. Impedance ratio type criterions in the form of Zo/Zi or Zi/Zo have been proposed to solve these stability issues. However, existing ratio type criterions still have problems in some cascade systems. Terminal characteristic of single module is studied and the different types of cascade system are defined in this paper. It can be seen that the validity of conventional impedance ratio type criterion would be influenced by the right half plane zeros (RHZ) in terminal impedance of each module in the Z+Z type cascade system. Two improved criteria are proposed for the Z+Z type cascade system: one is improved ratio type criterion considering the RHZ in terminal impedance of each module; another one is sum type criterion which doesn't need the information about RHZ in terminal impedance of each module. The experiment results prove the validity of these two improved criterions.

Original languageEnglish
Title of host publication2013 IEEE Energy Conversion Congress and Exposition
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages434-441
Number of pages8
ISBN (Electronic)9781479903368
ISBN (Print)9781479903351
DOIs
Publication statusPublished - 2013
Externally publishedYes
Event5th Annual IEEE Energy Conversion Congress and Exhibition, ECCE 2013 - Denver, CO, United States
Duration: 15 Sep 201319 Sep 2013

Other

Other5th Annual IEEE Energy Conversion Congress and Exhibition, ECCE 2013
CountryUnited States
CityDenver, CO
Period15/09/1319/09/13

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Fangcheng, L., Jinjun, L., Haodong, Z., Danhong, X., Ul, H. S., & Linyuan, Z. (2013). Stability issues of Z+Z or Y+Y type cascade system. In 2013 IEEE Energy Conversion Congress and Exposition (pp. 434-441). [6646734] Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/ECCE.2013.6646734