Two nominally identical ultra-low vibration cryocooled microwave sapphire oscillators are compared. The phase noise of a single oscillator was measured to be -105 dBc/Hz at 1 Hz offset on the 11.2 GHz carrier and is characterized by white frequency noise. The Allan deviation at 1s integration time, with drift removed, is 5.8 × 10 -16. Between 0.1 and 100 s, the frequency stability is white frequency noise limited with a minimum of 1.6 × 10 -16 around 100 s. The long-term stability of the oscillator degrades due to a sensitivity to diurnal room temperature changes. In the absence of this effect the oscillator has potential to reach a stability below 10 -16.
|Title of host publication||2012 IEEE International Frequency Control Symposium, IFCS 2012, Proceedings|
|Number of pages||2|
|Publication status||Published - 2012|
|Event||2012 66th IEEE International Frequency Control Symposium, IFCS 2012 - Baltimore, MD, United States|
Duration: 21 May 2012 → 24 May 2012
|Other||2012 66th IEEE International Frequency Control Symposium, IFCS 2012|
|Period||21/05/12 → 24/05/12|