State-of-the-art cryocooled sapphire oscillators

Nitin R. Nand*, John G. Hartnett, Chuan Lu

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

Abstract

Two nominally identical ultra-low vibration cryocooled microwave sapphire oscillators are compared. The phase noise of a single oscillator was measured to be -105 dBc/Hz at 1 Hz offset on the 11.2 GHz carrier and is characterized by white frequency noise. The Allan deviation at 1s integration time, with drift removed, is 5.8 × 10 -16. Between 0.1 and 100 s, the frequency stability is white frequency noise limited with a minimum of 1.6 × 10 -16 around 100 s. The long-term stability of the oscillator degrades due to a sensitivity to diurnal room temperature changes. In the absence of this effect the oscillator has potential to reach a stability below 10 -16.

Original languageEnglish
Title of host publication2012 IEEE International Frequency Control Symposium, IFCS 2012, Proceedings
Pages631-632
Number of pages2
DOIs
Publication statusPublished - 2012
Event2012 66th IEEE International Frequency Control Symposium, IFCS 2012 - Baltimore, MD, United States
Duration: 21 May 201224 May 2012

Other

Other2012 66th IEEE International Frequency Control Symposium, IFCS 2012
CountryUnited States
CityBaltimore, MD
Period21/05/1224/05/12

Fingerprint Dive into the research topics of 'State-of-the-art cryocooled sapphire oscillators'. Together they form a unique fingerprint.

Cite this