Abstract
Two nominally identical ultra-low vibration cryocooled microwave sapphire oscillators are compared. The phase noise of a single oscillator was measured to be -105 dBc/Hz at 1 Hz offset on the 11.2 GHz carrier and is characterized by white frequency noise. The Allan deviation at 1s integration time, with drift removed, is 5.8 × 10 -16. Between 0.1 and 100 s, the frequency stability is white frequency noise limited with a minimum of 1.6 × 10 -16 around 100 s. The long-term stability of the oscillator degrades due to a sensitivity to diurnal room temperature changes. In the absence of this effect the oscillator has potential to reach a stability below 10 -16.
| Original language | English |
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| Title of host publication | 2012 IEEE International Frequency Control Symposium, IFCS 2012, Proceedings |
| Pages | 631-632 |
| Number of pages | 2 |
| DOIs | |
| Publication status | Published - 2012 |
| Event | 2012 66th IEEE International Frequency Control Symposium, IFCS 2012 - Baltimore, MD, United States Duration: 21 May 2012 → 24 May 2012 |
Other
| Other | 2012 66th IEEE International Frequency Control Symposium, IFCS 2012 |
|---|---|
| Country/Territory | United States |
| City | Baltimore, MD |
| Period | 21/05/12 → 24/05/12 |