Statistics of single-electron signals in electron-multiplying charge-coupled devices

Taras Plakhotnik*, Arjun Chennu, Andrei V. Zvyagin

*Corresponding author for this work

Research output: Contribution to journalArticle

16 Citations (Scopus)
59 Downloads (Pure)

Abstract

Electron-multiplying charge coupled devices promise to revolutionize ultrasensitive optical imaging. The authors present a simple methodology allowing reliable measurement of camera characteristics and statistics of single-electron events, compare the measurements to a simple theoretical model, and report camera performance in a truly photon-counting regime that eliminates the excess noise related to fluctuations of the multiplication gain.

Original languageEnglish
Pages (from-to)618-622
Number of pages5
JournalIEEE Transactions on Electron Devices
Volume53
Issue number4
DOIs
Publication statusPublished - Apr 2006
Externally publishedYes

Bibliographical note

Copyright 2006 IEEE. Reprinted from IEEE transactions on electron devices. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Macquarie University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.

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