Stitching Interferometry

A Flexible Solution for Surface Metrology

Paul Murphy*, Greg Forbes, Jon Fleig, Paul Dumas, Marc Tricard

*Corresponding author for this work

Research output: Contribution to Newspaper/Magazine/WebsiteArticle

137 Citations (Scopus)


The use of subaperture stitching in increasing the capability of an interferometer is discussed. Parts that would require large transmission spheres can be tested on a stitching system at higher resolution. Advances in the development of algorithms allow system calibration to be an integral part of a stitching system. This enables calibration of lateral errors as well as accurate determination of magnification and distortion.

Original languageEnglish
Number of pages6
Specialist publicationOptics and Photonics News
Publication statusPublished - 2003
Externally publishedYes


Cite this

Murphy, P., Forbes, G., Fleig, J., Dumas, P., & Tricard, M. (2003). Stitching Interferometry: A Flexible Solution for Surface Metrology. Optics and Photonics News, 14(5), 38-43.