Abstract
The use of subaperture stitching in increasing the capability of an interferometer is discussed. Parts that would require large transmission spheres can be tested on a stitching system at higher resolution. Advances in the development of algorithms allow system calibration to be an integral part of a stitching system. This enables calibration of lateral errors as well as accurate determination of magnification and distortion.
| Original language | English |
|---|---|
| Pages | 38-43 |
| Number of pages | 6 |
| Volume | 14 |
| No. | 5 |
| Specialist publication | Optics and Photonics News |
| Publication status | Published - 2003 |
| Externally published | Yes |