Super-resolution imaging of micro- and nanoplastics using confocal Raman with Gaussian surface fitting and deconvolution

Cheng Fang*, Yunlong Luo, Ravi Naidu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)
43 Downloads (Pure)

Abstract

Confocal Raman imaging can directly identify and visualise microplastics and even nanoplastics. However, due to diffraction, the excitation laser spot has a size, which defines the image resolution. Consequently, it is difficult to image nanoplastic that is smaller than the diffraction limit. Within the laser spot, fortunately, the excitation energy density behaves an axially transcended distribution, or a 2D Gaussian distribution. By mapping the emission intensity of Raman signal, the imaged nanoplastic pattern is axially transcended as well and can be fitted as a 2D Gaussian surface via deconvolution, to re-construct the Raman image. The image re-construction can intentionally and selectively pick up the weak signal of nanoplastics, average the background noise/the variation of the Raman intensity, smoothen the image surface and re-focus the mapped pattern towards signal enhancement. Using this approach, along with nanoplastics models with known size for validation, real samples are also tested to image microplastics and nanoplastics released from the bushfire-burned face masks and water tanks. Even the bushfire-deviated surface group can be visualised as well, to monitor the different degrees of burning by visualising micro- and nanoplastics. Overall, this approach can effectively image regular shape of micro- and nanoplastics, capture nanoplastics smaller than the diffraction limit, and realise super-resolution imaging via confocal Raman.
Original languageEnglish
Article number124886
Pages (from-to)1-10
Number of pages10
JournalTalanta
Volume265
Early online date28 Jun 2023
DOIs
Publication statusPublished - 1 Dec 2023
Externally publishedYes

Bibliographical note

Copyright the Author(s) 2023. Version archived for private and non-commercial use with the permission of the author/s and according to publisher conditions. For further rights please contact the publisher.

Keywords

  • Raman imaging
  • Nanoplastics
  • Microplastics
  • Laser diffraction limit
  • Gaussian surface
  • Deconvolution
  • Image re-construction

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