TY - JOUR
T1 - TDFD-based measurement of analog-to-digital converter nonlinearity
AU - Rathmell, James
AU - Scott, Jonathan
AU - Parker, Anthony
PY - 1997/10
Y1 - 1997/10
N2 - Analog-to-digital converters (ADCs) are central to modern audio, video, and RF systems, with some modern converters providing 23 plus "significant" bits. With such systems, performance is usually limited by audible distortion. Consequently linearity tests, analogous to distortion measurements, are adapted to test performance. The total difference-frequency distortion (TDFD) test is a modern standard for distortion measurement in the audio field, and its uniquely powerful advantages may be transferred to the realm of ADC testing. Building on existing work, a straightforward TDFD test for ADC systems is described and demonstrated. Measurements of example ADC systems are presented. A simple relationship between distortion and effective bits is derived, as a measure of performance, and testing guidelines are given.
AB - Analog-to-digital converters (ADCs) are central to modern audio, video, and RF systems, with some modern converters providing 23 plus "significant" bits. With such systems, performance is usually limited by audible distortion. Consequently linearity tests, analogous to distortion measurements, are adapted to test performance. The total difference-frequency distortion (TDFD) test is a modern standard for distortion measurement in the audio field, and its uniquely powerful advantages may be transferred to the realm of ADC testing. Building on existing work, a straightforward TDFD test for ADC systems is described and demonstrated. Measurements of example ADC systems are presented. A simple relationship between distortion and effective bits is derived, as a measure of performance, and testing guidelines are given.
UR - http://www.scopus.com/inward/record.url?scp=0031245002&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:0031245002
SN - 0004-7554
VL - 45
SP - 832
EP - 840
JO - AES: Journal of the Audio Engineering Society
JF - AES: Journal of the Audio Engineering Society
IS - 10
ER -