Temperature effect on the electrical properties of chromium oxide (Cr 2O3) thin films

M. D. Julkarnain, J. Hossain, K. S. Sharif, K. A. Khan*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

20 Citations (Scopus)


Chromium Oxide (Cr2O3) thin films have been prepared by thermal evaporation onto glass substrate at a pressure of about 6×10-4 Pa. Structural and compositional analysis has been carried out by XRD, SEM and EDAX method. The heating and cooling cycles of the samples are reversible in the investigated temperature range after successive heat-treatment in air. Temperature dependence of electrical conductivity shows a semiconducting behavior. The thickness dependence of conductivity is well in conformity with the Fuchs-Sondheimar theory. The Hall coefficient shows a positive sign exhibiting p-type carriers. Optical study has been employed to determine the band gap of the samples.

Original languageEnglish
Pages (from-to)485-490
Number of pages6
JournalJournal of Optoelectronics and Advanced Materials
Issue number5
Publication statusPublished - May 2011
Externally publishedYes


  • Chromium Oxide
  • Electrical properties
  • Optical properties
  • Thermal evaporation
  • Thin films

Fingerprint Dive into the research topics of 'Temperature effect on the electrical properties of chromium oxide (Cr <sub>2</sub>O<sub>3</sub>) thin films'. Together they form a unique fingerprint.

Cite this