Temporary grating coupler structures using localised refractive index engineering

R. Topley, G. Martinez-Jimenez, L. O'Faolain, N. Healy, S. Mailis, D. J. Thomson, F. Y. Gardes, A. C. Peacock, D. N. R. Payne, G. Z. Mashanovich, G. T. Reed

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

Abstract

We demonstrate an erasable grating coupler which allows optical device testing throughout the fabrication process without impairing final circuit performance. Refractive index variation is introduced using ion implantation and can be subsequently removed using laser annealing.

Original languageEnglish
Title of host publication2014 Asia Communications and Photonics Conference (ACP)
Subtitle of host publicationproceedings
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Number of pages3
ISBN (Electronic)9781557528520
ISBN (Print)9781728116310
Publication statusPublished - 2014
Externally publishedYes
EventAsia Communications and Photonics Conference, ACPC 2014 - Shanghai, China
Duration: 11 Nov 201414 Nov 2014

Publication series

Name
ISSN (Print)2162-108X
ISSN (Electronic)2162-1098

Conference

ConferenceAsia Communications and Photonics Conference, ACPC 2014
CountryChina
CityShanghai
Period11/11/1414/11/14

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  • Cite this

    Topley, R., Martinez-Jimenez, G., O'Faolain, L., Healy, N., Mailis, S., Thomson, D. J., ... Reed, G. T. (2014). Temporary grating coupler structures using localised refractive index engineering. In 2014 Asia Communications and Photonics Conference (ACP): proceedings [AW3B.2] Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE).