@inproceedings{2f1f4191d3fe4ae4a3abeda53593849f,
title = "Temporary grating coupler structures using localised refractive index engineering",
abstract = "We demonstrate an erasable grating coupler which allows optical device testing throughout the fabrication process without impairing final circuit performance. Refractive index variation is introduced using ion implantation and can be subsequently removed using laser annealing.",
author = "R. Topley and G. Martinez-Jimenez and L. O'Faolain and N. Healy and S. Mailis and Thomson, {D. J.} and Gardes, {F. Y.} and Peacock, {A. C.} and Payne, {D. N. R.} and Mashanovich, {G. Z.} and Reed, {G. T.}",
year = "2014",
language = "English",
isbn = "9781728116310",
publisher = "Institute of Electrical and Electronics Engineers (IEEE)",
booktitle = "2014 Asia Communications and Photonics Conference (ACP)",
address = "United States",
note = "Asia Communications and Photonics Conference, ACPC 2014 ; Conference date: 11-11-2014 Through 14-11-2014",
}