The application of in-situ 3D X-ray diffraction in annealing experiments

first interpretation of substructure development in deformed NaCl

Verity Borthwick*, Søren Schmidt, Sandra Piazolo, Carsten Gundlach, Albert Griera, Paul D. Bons, Mark W. Jessell

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

3 Citations (Scopus)

Abstract

In-situ 3D X-ray diffraction (3DXRD) annealing experiments were conducted at the ID-11 beamline at the European Synchrotron Radiation Facility in Grenoble. This allowed us to nondestructively document and subsequently analyse the development of substructures during heating, without the influence of surface effects. A sample of deformed single crystal halite was heated to between 260-400 °. Before and after heating a volume of 500 by 500 by 300 μm was mapped using a planar beam, which was translated over the sample volume at intervals of 5-10 μm in the vertical dimension. In the following we present partially reconstructed orientation maps over one layer before and after heating for 240min at 260 °. Additional small syn-heating "maps" over a constrained sample rotation of 12-30°. The purpose of this was to illuminate a few reflections from 1 or 2 subgrains and follow their evolution during heating. Preliminary results show that significant changes occurred within the sample volume, for which, surface effects can be excluded. Results show a number of processes, including: i) change in subgrain boundary misorientation angle and ii) subgrain subdivision into areas of similar lattice orientation with new subgrain boundary formation. These results demonstrate that 3DXRD coupled with in-situ heating is a successful non-destructive technique for examining real-time postdeformational annealing in strongly deformed crystalline materials with complicated microstructures.

Original languageEnglish
Title of host publicationRecrystallization and Grain Growth IV
Editors E.J. Palmiere, B.P. Wynne
Place of PublicationZurich
PublisherTrans Tech Publications
Pages461-466
Number of pages6
ISBN (Print)9783037853900
DOIs
Publication statusPublished - Jul 2012
Event4th International Conference on Recrystallization and Grain Growth, ReX and GG IV - Sheffield, United Kingdom
Duration: 4 Jul 20109 Jul 2010

Publication series

NameMaterials Science Forum
Volume715-716
ISSN (Print)02555476

Other

Other4th International Conference on Recrystallization and Grain Growth, ReX and GG IV
CountryUnited Kingdom
CitySheffield
Period4/07/109/07/10

Keywords

  • Annealing
  • Halite
  • In-situ
  • Substructure
  • X-ray diffraction

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