The effect of growth temperature on the structure of GaSb/GaAs quantum dots grown by MOCVD

M. Motlan, E. M. Goldys, T. L. Tansley

    Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

    Abstract

    Dot size and density are important factors that determine the physical properties of semiconductor materials based on arrays of self-assembled dots (SADs). We report the effects of growth temperature on strained GaSb three-dimensional (3D) islands on GaAs grown by metalorganic chemical vapor deposition (MOCVD). In this work we use growth temperatures of 480°C, 500°C, 520°C, and 540°C. The results show decreasing dot widths as growth temperature increases. On the other hand, the dot densities generally increase. We believe that the increase in growth temperature increases adatom diffusion length and consequently leads to more extensive dots. However, fragmentation due to elastic relaxation appears to compensate at higher temperatures. As a result the dot density increases again, while average sizes fall.

    Original languageEnglish
    Title of host publication2000 International Semiconducting and Insulating Materials Conference, SIMC 2000
    Place of PublicationCanberra
    PublisherInstitute of Electrical and Electronics Engineers (IEEE)
    Pages236-239
    Number of pages4
    Volume2000-January
    ISBN (Print)0780358147
    DOIs
    Publication statusPublished - 2000
    Event11th International Semiconducting and Insulating Materials Conference, SIMC 2000 - Canberra, Australia
    Duration: 3 Jul 20007 Jul 2000

    Other

    Other11th International Semiconducting and Insulating Materials Conference, SIMC 2000
    Country/TerritoryAustralia
    CityCanberra
    Period3/07/007/07/00

    Keywords

    • Atomic force microscopy
    • Gallium arsenide
    • Laboratories
    • MOCVD
    • Quantum dot lasers
    • Quantum dots
    • Scanning electron microscopy
    • Substrates
    • Temperature
    • US Department of Transportation

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