The experimental study of dynamic thermal expansion of Bi-based high Tc superconductors

J. D. Guo*, W. L. Zhao, R. S. Qin, L. Hua, H. Tang, G. H. He, Y. Z. Wang, G. W. Qiao, B. L. Zhou

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

In this work, we have measured the dynamic process of thermal expansion (DPTE) of some Bi-based high-Tc superconductor samples in the temperature range 80∼130K and found that the dynamic thermal expansion of Bi-based superconductor samples (Bi2Sr2Ca2Cu3Oy (Tc=105K) and Bi1.8Pb0.4Sr2Ca2Cu 3.15Ge0.05Oy, (Tc=102K)) change suddenly across Tc. The mechanism of this phenomenon is left to be studied.

Original languageEnglish
Pages (from-to)1449-1450
Number of pages2
JournalPhysica C: Superconductivity and its Applications
Volume282-287
Issue numberPART 3
Publication statusPublished - Aug 1997
Externally publishedYes

Fingerprint

Dive into the research topics of 'The experimental study of dynamic thermal expansion of Bi-based high T<sub>c</sub> superconductors'. Together they form a unique fingerprint.

Cite this