The Influence of rejection of a fraction of the single photoelectron peak in liquid scintillation counting

L. Mo; P. Cassette; C. Baldock

doi:10.1016/j.nima.2005.11.210

The Influence of rejection of a fraction of the single photoelectron peak in liquid scintillation counting

L. Mo, P. Cassette, C. Baldock

Research output: Contribution to journal › Article › peer-review

9 Citations (Scopus)

Abstract

Zero discrimination level setting of liquid scintillation systems for counting of all single photoelectron pulses is required by both triple-to-double coincidence ratio (TDCR) and CIEMAT/NIST methods. However, this requirement may not be able to be met in some circumstances. The influence of rejection of a fraction of the single photoelectron peak has been studied both theoretically and experimentally on ³H, ⁶³Ni, ¹⁴C and ⁹⁰Sr/⁹⁰Y for both the TDCR and CIEMAT/NIST methods. A modified formula for calculation of efficiency is given in consideration of the rejected fraction of the single photoelectron peak.

Original language	English
Pages (from-to)	490-496
Number of pages	7
Journal	Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
Volume	558
Issue number	2
DOIs	https://doi.org/10.1016/j.nima.2005.11.210
Publication status	Published - 2006
Externally published	Yes

Keywords

¹⁴C and ⁹⁰Sr/⁹⁰Y
³H
⁶³Ni
CIEMAT/NIST
Fraction correction
Single photoelectron peak
TDCR

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10.1016/j.nima.2005.11.210

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title = "The Influence of rejection of a fraction of the single photoelectron peak in liquid scintillation counting",

abstract = "Zero discrimination level setting of liquid scintillation systems for counting of all single photoelectron pulses is required by both triple-to-double coincidence ratio (TDCR) and CIEMAT/NIST methods. However, this requirement may not be able to be met in some circumstances. The influence of rejection of a fraction of the single photoelectron peak has been studied both theoretically and experimentally on ³H, ⁶³Ni, ¹⁴C and ⁹⁰Sr/⁹⁰Y for both the TDCR and CIEMAT/NIST methods. A modified formula for calculation of efficiency is given in consideration of the rejected fraction of the single photoelectron peak.",

keywords = "¹⁴C and ⁹⁰Sr/⁹⁰Y, ³H, ⁶³Ni, CIEMAT/NIST, Fraction correction, Single photoelectron peak, TDCR",

author = "L. Mo and P. Cassette and C. Baldock",

year = "2006",

doi = "10.1016/j.nima.2005.11.210",

language = "English",

volume = "558",

pages = "490--496",

journal = "Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment",

issn = "0168-9002",

publisher = "Elsevier",

number = "2",

}

The Influence of rejection of a fraction of the single photoelectron peak in liquid scintillation counting. / Mo, L.; Cassette, P.; Baldock, C.

In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment, Vol. 558, No. 2, 2006, p. 490-496.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - The Influence of rejection of a fraction of the single photoelectron peak in liquid scintillation counting

AU - Mo, L.

AU - Cassette, P.

AU - Baldock, C.

PY - 2006

Y1 - 2006

N2 - Zero discrimination level setting of liquid scintillation systems for counting of all single photoelectron pulses is required by both triple-to-double coincidence ratio (TDCR) and CIEMAT/NIST methods. However, this requirement may not be able to be met in some circumstances. The influence of rejection of a fraction of the single photoelectron peak has been studied both theoretically and experimentally on ³H, ⁶³Ni, ¹⁴C and ⁹⁰Sr/⁹⁰Y for both the TDCR and CIEMAT/NIST methods. A modified formula for calculation of efficiency is given in consideration of the rejected fraction of the single photoelectron peak.

AB - Zero discrimination level setting of liquid scintillation systems for counting of all single photoelectron pulses is required by both triple-to-double coincidence ratio (TDCR) and CIEMAT/NIST methods. However, this requirement may not be able to be met in some circumstances. The influence of rejection of a fraction of the single photoelectron peak has been studied both theoretically and experimentally on ³H, ⁶³Ni, ¹⁴C and ⁹⁰Sr/⁹⁰Y for both the TDCR and CIEMAT/NIST methods. A modified formula for calculation of efficiency is given in consideration of the rejected fraction of the single photoelectron peak.

KW - ¹⁴C and ⁹⁰Sr/⁹⁰Y

KW - ³H

KW - ⁶³Ni

KW - CIEMAT/NIST

KW - Fraction correction

KW - Single photoelectron peak

KW - TDCR

U2 - 10.1016/j.nima.2005.11.210

DO - 10.1016/j.nima.2005.11.210

M3 - Article

VL - 558

SP - 490

EP - 496

JO - Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment

JF - Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment

SN - 0168-9002

IS - 2

ER -

The Influence of rejection of a fraction of the single photoelectron peak in liquid scintillation counting

Abstract

Keywords

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