TY - GEN
T1 - The interaction between schema matching and record matching in data integration (Extended Abstract)
AU - Gu, Binbin
AU - Li, Zhixu
AU - Zhang, Xiangliang
AU - Liu, An
AU - Liu, Guanfeng
AU - Zheng, Kai
AU - Zhao, Lei
AU - Zhou, Xiaofang
PY - 2017
Y1 - 2017
N2 - Schema Matching (SM) and Record Matching (RM) are two necessary steps in integrating multiple relational tables of different schemas, where SM unifies the schemas and RM detects records referring to the same real-world entity. The two processes have been thoroughly studied separately, but few attention has been paid to the interaction of SM and RM. In this work we find that, even alternating them in a simple manner, SM and RM can benefit from each other to reach a better integration performance (i.e., in terms of precision and recall). Therefore, combining SM and RM is a promising solution for improving data integration.
AB - Schema Matching (SM) and Record Matching (RM) are two necessary steps in integrating multiple relational tables of different schemas, where SM unifies the schemas and RM detects records referring to the same real-world entity. The two processes have been thoroughly studied separately, but few attention has been paid to the interaction of SM and RM. In this work we find that, even alternating them in a simple manner, SM and RM can benefit from each other to reach a better integration performance (i.e., in terms of precision and recall). Therefore, combining SM and RM is a promising solution for improving data integration.
UR - http://www.scopus.com/inward/record.url?scp=85021253226&partnerID=8YFLogxK
U2 - 10.1109/ICDE.2017.23
DO - 10.1109/ICDE.2017.23
M3 - Conference proceeding contribution
AN - SCOPUS:85021253226
T3 - Proceedings - International Conference on Data Engineering
SP - 33
EP - 34
BT - Proceedings - 2017 IEEE 33rd International Conference on Data Engineering, ICDE 2017
PB - Institute of Electrical and Electronics Engineers (IEEE)
CY - Los Alamitos, CA
T2 - 33rd IEEE International Conference on Data Engineering, ICDE 2017
Y2 - 19 April 2017 through 22 April 2017
ER -