The electronic structure of thin films of the organic semiconductor tin phthalocyanine (SnPc) has been investigated by resonant and non-resonant soft X-ray emission (RXES and XES) at the carbon and nitrogen K-edges with excitation energies determined from near edge X-ray absorption fine structure (NEXAFS) spectra. The resultant NEXAFS and RXES spectra measure the unoccupied and occupied C and N 2p projected density of states, respectively. In particular, RXES results in site-specific C 2p and N 2p local partial density of states (LPDOS) being measured. An angular dependence of C 2p and N 2p RXES spectra of SnPc was observed. The observed angular dependence, the measured LPDOS and their correspondence to the results of density functional theory calculations are discussed. Observed differences on the same site-specific features between resonant (non-ionising) and non-resonant (ionising) NXES spectra are attributed to symmetry selection and screening.
- Resonant X-ray emission spectroscopy
- Tin phthalocyanine
- X-ray absorption spectroscopy
- X-ray fluorescence