The local electronic structure of tin phthalocyanine studied by resonant soft X-ray emission spectroscopies

N. Peltekis, B. N. Holland, L. F J Piper, A. DeMasi, K. E. Smith, J. E. Downes, I. T. McGovern, C. McGuinness*

*Corresponding author for this work

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

The electronic structure of thin films of the organic semiconductor tin phthalocyanine (SnPc) has been investigated by resonant and non-resonant soft X-ray emission (RXES and XES) at the carbon and nitrogen K-edges with excitation energies determined from near edge X-ray absorption fine structure (NEXAFS) spectra. The resultant NEXAFS and RXES spectra measure the unoccupied and occupied C and N 2p projected density of states, respectively. In particular, RXES results in site-specific C 2p and N 2p local partial density of states (LPDOS) being measured. An angular dependence of C 2p and N 2p RXES spectra of SnPc was observed. The observed angular dependence, the measured LPDOS and their correspondence to the results of density functional theory calculations are discussed. Observed differences on the same site-specific features between resonant (non-ionising) and non-resonant (ionising) NXES spectra are attributed to symmetry selection and screening.

Original languageEnglish
Pages (from-to)764-766
Number of pages3
JournalApplied Surface Science
Volume255
Issue number3
DOIs
Publication statusPublished - 30 Nov 2008

Keywords

  • Resonant X-ray emission spectroscopy
  • SnPc
  • Tin phthalocyanine
  • X-ray absorption spectroscopy
  • X-ray fluorescence

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