TY - JOUR
T1 - The resistive-heating characterization of laser heating system and LaB 6 characterization of X-ray diffraction of beamline 12.2.2 at advanced light source
AU - Yan, Jinyuan
AU - Knight, Jason
AU - Kunz, Martin
AU - Vennila Raju, Selva
AU - Chen, Bin
AU - Gleason, Arianna E.
AU - Godwal, Budhiram K.
AU - Geballe, Zack
AU - Jeanloz, Raymond
AU - Clark, Simon M.
PY - 2010/8
Y1 - 2010/8
N2 - X-ray diffraction from LaB6 standards document a precision of 478 ppm in lattice-parameter determinations for beamline 12.2.2 at Lawrence Berkeley National Laboratory′s Advanced Light Source, a facility for characterizing materials at high pressures and temperatures using laser- and resistance-heated diamond cells. Melting of Ni, Mo, Pt and W, resistively heated at 1 atm pressure in Ar, provides a validation of the beamline spectroradiometric system that is used to determine sample temperatures. The known melting temperatures, which range from 1665 to 3860 K for these metals, are all reproduced to within ±80 K.
AB - X-ray diffraction from LaB6 standards document a precision of 478 ppm in lattice-parameter determinations for beamline 12.2.2 at Lawrence Berkeley National Laboratory′s Advanced Light Source, a facility for characterizing materials at high pressures and temperatures using laser- and resistance-heated diamond cells. Melting of Ni, Mo, Pt and W, resistively heated at 1 atm pressure in Ar, provides a validation of the beamline spectroradiometric system that is used to determine sample temperatures. The known melting temperatures, which range from 1665 to 3860 K for these metals, are all reproduced to within ±80 K.
UR - http://www.scopus.com/inward/record.url?scp=77955553375&partnerID=8YFLogxK
U2 - 10.1016/j.jpcs.2010.03.030
DO - 10.1016/j.jpcs.2010.03.030
M3 - Article
AN - SCOPUS:77955553375
SN - 0022-3697
VL - 71
SP - 1179
EP - 1182
JO - Journal of Physics and Chemistry of Solids
JF - Journal of Physics and Chemistry of Solids
IS - 8
ER -