Abstract
Thermal annealing of n-type liquid phase epitaxial gallium arsenide is examined. It is shown that low 1015 cm-3 n-type electrically active impurity levels can be reduced to 3 × 1013 cm-3 by long term annealing. Conversely, it is also shown that p-type liquid phase epitaxial (LPE) gallium arsenide when thermally annealed will show an increase in the net acceptor density. A mechanism for this effect is proposed.
Original language | English |
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Pages (from-to) | 367-369 |
Number of pages | 3 |
Journal | Journal of Crystal Growth |
Volume | 135 |
Issue number | 1-2 |
DOIs | |
Publication status | Published - Jan 1994 |