Abstract
Thermal annealing of n-type liquid phase epitaxial gallium arsenide is examined. It is shown that low 1015 cm-3 n-type electrically active impurity levels can be reduced to 3 × 1013 cm-3 by long term annealing. Conversely, it is also shown that p-type liquid phase epitaxial (LPE) gallium arsenide when thermally annealed will show an increase in the net acceptor density. A mechanism for this effect is proposed.
| Original language | English |
|---|---|
| Pages (from-to) | 367-369 |
| Number of pages | 3 |
| Journal | Journal of Crystal Growth |
| Volume | 135 |
| Issue number | 1-2 |
| DOIs | |
| Publication status | Published - Jan 1994 |