We report a comparative study of the crystalline quality of thick GaN layers grown by hydride vapour phase epitaxy, using a nitridation and a GaCl pretreatment of the sapphire as well as a reactive sputtered AlN buffer and metalorganic chemical vapour deposition grown GaN `template' layers. The structure quality was investigated using X-ray diffraction measurement and cathodoluminescence spectroscopy and imaging of cross-section of the films. The morphology of the layers was revealed by optical and atomic force microscopy. A distinct reduction of both the columnar near-interface region and the domain formation were observed in layers grown on AlN and GaN `template' buffers resulting in improved bulk quality and significant smoother film surfaces.
|Number of pages||5|
|Journal||Physica Status Solidi (A) Applied Research|
|Publication status||Published - Nov 1999|