Towards generic calibration

James G. Rathmell, Peter S. Blockley

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution

Original language	English
Title of host publication	ARFTG Conference Digest
Place of Publication	New York, USA
Publisher	IEEE:Institute of Electrical Electronics Engineers Inc
Pages	1-4
Number of pages	4
ISBN (Print)	0780388585
DOIs	https://doi.org/10.1109/ARFTGS.2005.1500559
Publication status	Published - 2005
Event	Automatic RF Techniques Group (ARFTG) 2005 - Long Beach, California Duration: 17 Jun 2005 → 17 Jun 2005

Conference	Automatic RF Techniques Group (ARFTG) 2005
City	Long Beach, California
Period	17/06/05 → 17/06/05

Access to Document

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title = "Towards generic calibration",

author = "Rathmell, {James G.} and Blockley, {Peter S.}",

year = "2005",

doi = "10.1109/ARFTGS.2005.1500559",

language = "English",

isbn = "0780388585",

pages = "1--4",

booktitle = "ARFTG Conference Digest",

publisher = "IEEE:Institute of Electrical Electronics Engineers Inc",

note = "Automatic RF Techniques Group (ARFTG) 2005 ; Conference date: 17-06-2005 Through 17-06-2005",

}

TY - GEN

T1 - Towards generic calibration

AU - Rathmell, James G.

AU - Blockley, Peter S.

PY - 2005

Y1 - 2005

U2 - 10.1109/ARFTGS.2005.1500559

DO - 10.1109/ARFTGS.2005.1500559

M3 - Conference proceeding contribution

SN - 0780388585

SP - 1

EP - 4

BT - ARFTG Conference Digest

PB - IEEE:Institute of Electrical Electronics Engineers Inc

CY - New York, USA

T2 - Automatic RF Techniques Group (ARFTG) 2005

Y2 - 17 June 2005 through 17 June 2005

ER -