Towards generic calibration

James G. Rathmell, Peter S. Blockley

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

4 Citations (Scopus)
Original languageEnglish
Title of host publicationARFTG Conference Digest
Place of PublicationNew York, USA
PublisherIEEE:Institute of Electrical Electronics Engineers Inc
Pages1-4
Number of pages4
ISBN (Print)0780388585
DOIs
Publication statusPublished - 2005
EventAutomatic RF Techniques Group (ARFTG) 2005 - Long Beach, California
Duration: 17 Jun 200517 Jun 2005

Conference

ConferenceAutomatic RF Techniques Group (ARFTG) 2005
CityLong Beach, California
Period17/06/0517/06/05

Cite this