Trace element analysis of NIST SRM 614 and 616 glass reference materials by laser ablation microprobe-inductively coupled plasma-mass spectrometry

Masanori Kurosawa*, Simon E. Jackson, Shigeho Sueno

*Corresponding author for this work

    Research output: Contribution to journalArticle

    32 Citations (Scopus)

    Abstract

    Fifty elements in NIST SRM 614 and 616 glass reference materials were determined by laser ablation microprobe-inductively coupled plasma-mass spectrometry (LAM-ICP-MS). The values determined for NIST SRM 614 agreed well with the NIST-certified and information values (mean relative difference ± 3.6%), except for B, Sc and Sb. The values determined for NIST SRM 616 agreed with the NIST-certified and information values within a mean relative difference of ±1.5%/ except for B, Sc and Ga. In addition, at an 80 μm sampling scale, NIST SRM 614 and 616 glass discs were homogeneous for trace elements within the observed precisions of 5 and 15% (mean), respectively. Detection limits were in the range 0.01 - 0.3 μg g-1 for elements of lower mass numbers (amu < 80) and 1 - 10 ng g-1 for heavy elements (amu > 80). Detection at the sub ng g-1 level is possible for most of the heavy elements by using an ablation pit size larger than 100 μm.

    Original languageEnglish
    Pages (from-to)75-84
    Number of pages10
    JournalGeostandards Newsletter
    Volume26
    Issue number1
    DOIs
    Publication statusPublished - 2002

    Keywords

    • Homogeneity
    • LAM-ICP-MS
    • Laser-ablalion
    • Microprobe
    • NIST glass
    • Trace element analysis

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