Transient field-plate thermometry demonstrated on a 20-W Xband GaN power amplifier

Simon J. Mahon; Melissa C. Gorman; Michael C. Heimlich

doi:10.23919/EuMIC50153.2022.9783718

Transient field-plate thermometry demonstrated on a 20-W Xband GaN power amplifier

Simon J. Mahon^*, Melissa C. Gorman, Michael C. Heimlich

^*Corresponding author for this work

School of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

2 Citations (Scopus)

Abstract

Transient field-plate thermometry is demonstrated experimentally on a 20-W X-band GaN power. The technique is similar to gate-resistance thermometry but more convenient to implement in a power amplifier layout close to the heat source, to maintain accuracy, and without increasing MMIC dimensions. The new technique is used to extract the thermal time constants for heating and cooling under pulsed operation.

Original language	English
Title of host publication	2021 16th European Microwave Integrated Circuits Conference proceedings
Place of Publication	Belgium
Publisher	European Microwave Association
Pages	148-151
Number of pages	4
ISBN (Electronic)	9782874870644
ISBN (Print)	9781665447225
DOIs	https://doi.org/10.23919/EuMIC50153.2022.9783718
Publication status	Published - 2021
Event	16th European Microwave Integrated Circuits Conference, EuMIC 2021 - London, United Kingdom Duration: 3 Apr 2022 → 4 Apr 2022

Conference

Conference	16th European Microwave Integrated Circuits Conference, EuMIC 2021
Country/Territory	United Kingdom
City	London
Period	3/04/22 → 4/04/22

Keywords

Gallium nitride
MMICs
power amplifier
temperature measurement

Access to Document

10.23919/EuMIC50153.2022.9783718

Cite this

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title = "Transient field-plate thermometry demonstrated on a 20-W Xband GaN power amplifier",

abstract = "Transient field-plate thermometry is demonstrated experimentally on a 20-W X-band GaN power. The technique is similar to gate-resistance thermometry but more convenient to implement in a power amplifier layout close to the heat source, to maintain accuracy, and without increasing MMIC dimensions. The new technique is used to extract the thermal time constants for heating and cooling under pulsed operation.",

keywords = "Gallium nitride, MMICs, power amplifier, temperature measurement",

author = "Mahon, {Simon J.} and Gorman, {Melissa C.} and Heimlich, {Michael C.}",

year = "2021",

doi = "10.23919/EuMIC50153.2022.9783718",

language = "English",

isbn = "9781665447225",

pages = "148--151",

booktitle = "2021 16th European Microwave Integrated Circuits Conference proceedings",

publisher = "European Microwave Association",

note = "16th European Microwave Integrated Circuits Conference, EuMIC 2021 ; Conference date: 03-04-2022 Through 04-04-2022",

}

Mahon, SJ , Gorman, MC & Heimlich, MC 2021, Transient field-plate thermometry demonstrated on a 20-W Xband GaN power amplifier. in 2021 16th European Microwave Integrated Circuits Conference proceedings. European Microwave Association, Belgium, pp. 148-151, 16th European Microwave Integrated Circuits Conference, EuMIC 2021, London, United Kingdom, 3/04/22. https://doi.org/10.23919/EuMIC50153.2022.9783718

Transient field-plate thermometry demonstrated on a 20-W Xband GaN power amplifier. / Mahon, Simon J.; Gorman, Melissa C.; Heimlich, Michael C.
2021 16th European Microwave Integrated Circuits Conference proceedings. Belgium: European Microwave Association, 2021. p. 148-151.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

TY - GEN

T1 - Transient field-plate thermometry demonstrated on a 20-W Xband GaN power amplifier

AU - Mahon, Simon J.

AU - Gorman, Melissa C.

AU - Heimlich, Michael C.

PY - 2021

Y1 - 2021

N2 - Transient field-plate thermometry is demonstrated experimentally on a 20-W X-band GaN power. The technique is similar to gate-resistance thermometry but more convenient to implement in a power amplifier layout close to the heat source, to maintain accuracy, and without increasing MMIC dimensions. The new technique is used to extract the thermal time constants for heating and cooling under pulsed operation.

AB - Transient field-plate thermometry is demonstrated experimentally on a 20-W X-band GaN power. The technique is similar to gate-resistance thermometry but more convenient to implement in a power amplifier layout close to the heat source, to maintain accuracy, and without increasing MMIC dimensions. The new technique is used to extract the thermal time constants for heating and cooling under pulsed operation.

KW - Gallium nitride

KW - MMICs

KW - power amplifier

KW - temperature measurement

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U2 - 10.23919/EuMIC50153.2022.9783718

DO - 10.23919/EuMIC50153.2022.9783718

M3 - Conference proceeding contribution

AN - SCOPUS:85124392856

SN - 9781665447225

SP - 148

EP - 151

BT - 2021 16th European Microwave Integrated Circuits Conference proceedings

PB - European Microwave Association

CY - Belgium

T2 - 16th European Microwave Integrated Circuits Conference, EuMIC 2021

Y2 - 3 April 2022 through 4 April 2022

ER -

Transient field-plate thermometry demonstrated on a 20-W Xband GaN power amplifier

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Keywords

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