Two approaches to iterated belief contraction

Raghav Ramachandran*, Abhaya C. Nayak, Mehmet A. Orgun

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

Iterated Belief Contraction is a relatively less explored area in belief change and intuition for it is often driven by work in the area of iterated belief revision. For many of the iterable belief contraction functions defined in the literature, very little is known about their properties. In this paper we recall two iterable contraction functions, Natural contraction and Priority contraction, defined by Nayak and colleagues. Here we characterize both these contraction functions via some simple properties of iterated contraction.

Original languageEnglish
Title of host publicationKnowledge Science, Engineering and Management
Subtitle of host publicationThird International Conference, KSEM 2009, Vienna, Austria, November 25-27, 2009. Proceedings
EditorsDimitris Karagiannis, Zhi Jin
Place of PublicationBerlin
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages78-89
Number of pages12
ISBN (Electronic)9783642104886
ISBN (Print)9783642104879
DOIs
Publication statusPublished - 2009
Event3rd International Conference on Knowledge Science, Engineering and Management, KSEM 2009 - Vienna, Austria
Duration: 25 Nov 200927 Nov 2009

Publication series

NameLecture Notes in Computer Science
PublisherSpringer Berlin Heidelberg
Volume5914
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Other

Other3rd International Conference on Knowledge Science, Engineering and Management, KSEM 2009
CountryAustria
CityVienna
Period25/11/0927/11/09

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Ramachandran, R., Nayak, A. C., & Orgun, M. A. (2009). Two approaches to iterated belief contraction. In D. Karagiannis, & Z. Jin (Eds.), Knowledge Science, Engineering and Management: Third International Conference, KSEM 2009, Vienna, Austria, November 25-27, 2009. Proceedings (pp. 78-89). (Lecture Notes in Computer Science; Vol. 5914). Berlin: Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1007/978-3-642-10488-6_11