Abstract
Two nominally identical ultra-stable microwave oscillators are compared. Each incorporates a sapphire resonator cooled to near 6 K in an ultra-low vibration cryostat using a pulse-tube cryocooler. The phase noise for a single oscillator is measured at -105 dBc/Hz at 1 Hz offset on the 11.2 GHz carrier. The oscillator fractional frequency stability, after subtracting a linear frequency drift of 3. 5 × 10 - 14/day, is characterized by 5. 3 × 10 - 16 τ - 1 / 2 + 9 × 10 - 17 for integration times 0. 1 s < τ < 1000 s and is limited by a flicker frequency noise floor near 1 × 10 - 16.
Original language | English |
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Article number | 183501 |
Pages (from-to) | 1-4 |
Number of pages | 4 |
Journal | Applied Physics Letters |
Volume | 100 |
Issue number | 18 |
DOIs | |
Publication status | Published - 30 Apr 2012 |