Ultra-low-phase-noise cryocooled microwave dielectric-sapphire-resonator oscillators

John G. Hartnett; Nitin R. Nand; Chuan Lu

doi:10.1063/1.4709479

Ultra-low-phase-noise cryocooled microwave dielectric-sapphire-resonator oscillators

John G. Hartnett^*, Nitin R. Nand, Chuan Lu

^*Corresponding author for this work

Department of Physics and Astronomy

Research output: Contribution to journal › Article

54 Citations (Scopus)

Abstract

Two nominally identical ultra-stable microwave oscillators are compared. Each incorporates a sapphire resonator cooled to near 6 K in an ultra-low vibration cryostat using a pulse-tube cryocooler. The phase noise for a single oscillator is measured at -105 dBc/Hz at 1 Hz offset on the 11.2 GHz carrier. The oscillator fractional frequency stability, after subtracting a linear frequency drift of 3. 5 × 10 - 14/day, is characterized by 5. 3 × 10 - 16 τ - 1 / 2 + 9 × 10 - 17 for integration times 0. 1 s < τ < 1000 s and is limited by a flicker frequency noise floor near 1 × 10 - 16.

Original language	English
Article number	183501
Pages (from-to)	1-4
Number of pages	4
Journal	Applied Physics Letters
Volume	100
Issue number	18
DOIs	https://doi.org/10.1063/1.4709479
Publication status	Published - 30 Apr 2012

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title = "Ultra-low-phase-noise cryocooled microwave dielectric-sapphire-resonator oscillators",

abstract = "Two nominally identical ultra-stable microwave oscillators are compared. Each incorporates a sapphire resonator cooled to near 6 K in an ultra-low vibration cryostat using a pulse-tube cryocooler. The phase noise for a single oscillator is measured at -105 dBc/Hz at 1 Hz offset on the 11.2 GHz carrier. The oscillator fractional frequency stability, after subtracting a linear frequency drift of 3. 5 × 10 - 14/day, is characterized by 5. 3 × 10 - 16 τ - 1 / 2 + 9 × 10 - 17 for integration times 0. 1 s < τ < 1000 s and is limited by a flicker frequency noise floor near 1 × 10 - 16.",

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N2 - Two nominally identical ultra-stable microwave oscillators are compared. Each incorporates a sapphire resonator cooled to near 6 K in an ultra-low vibration cryostat using a pulse-tube cryocooler. The phase noise for a single oscillator is measured at -105 dBc/Hz at 1 Hz offset on the 11.2 GHz carrier. The oscillator fractional frequency stability, after subtracting a linear frequency drift of 3. 5 × 10 - 14/day, is characterized by 5. 3 × 10 - 16 τ - 1 / 2 + 9 × 10 - 17 for integration times 0. 1 s < τ < 1000 s and is limited by a flicker frequency noise floor near 1 × 10 - 16.

AB - Two nominally identical ultra-stable microwave oscillators are compared. Each incorporates a sapphire resonator cooled to near 6 K in an ultra-low vibration cryostat using a pulse-tube cryocooler. The phase noise for a single oscillator is measured at -105 dBc/Hz at 1 Hz offset on the 11.2 GHz carrier. The oscillator fractional frequency stability, after subtracting a linear frequency drift of 3. 5 × 10 - 14/day, is characterized by 5. 3 × 10 - 16 τ - 1 / 2 + 9 × 10 - 17 for integration times 0. 1 s < τ < 1000 s and is limited by a flicker frequency noise floor near 1 × 10 - 16.

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