Ultra-low-phase-noise cryocooled microwave dielectric-sapphire-resonator oscillators

John G. Hartnett*, Nitin R. Nand, Chuan Lu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

55 Citations (Scopus)

Abstract

Two nominally identical ultra-stable microwave oscillators are compared. Each incorporates a sapphire resonator cooled to near 6 K in an ultra-low vibration cryostat using a pulse-tube cryocooler. The phase noise for a single oscillator is measured at -105 dBc/Hz at 1 Hz offset on the 11.2 GHz carrier. The oscillator fractional frequency stability, after subtracting a linear frequency drift of 3. 5 × 10 - 14/day, is characterized by 5. 3 × 10 - 16 τ - 1 / 2 + 9 × 10 - 17 for integration times 0. 1 s < τ < 1000 s and is limited by a flicker frequency noise floor near 1 × 10 - 16.

Original languageEnglish
Article number183501
Pages (from-to)1-4
Number of pages4
JournalApplied Physics Letters
Volume100
Issue number18
DOIs
Publication statusPublished - 30 Apr 2012

Fingerprint

Dive into the research topics of 'Ultra-low-phase-noise cryocooled microwave dielectric-sapphire-resonator oscillators'. Together they form a unique fingerprint.

Cite this