Ultra-trace element analysis of NIST SRM 616 and 614 using laser ablation microprobe-inductively coupled plasma-mass spectrometry (LAM-ICP-MS): A comparison with secondary ion mass spectrometry (SIMS)

Ingo Horn*, Richard W. Hinton, Simon E. Jackson, Henry P. Longerich

*Corresponding author for this work

    Research output: Contribution to journal › Article › peer-review

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