Understanding field-effect passivation of black silicon: modeling charge carrier population control in compressed space charge regions

Shaozhou Wang, Xinyuan Wu, Fajun Ma, Yu Zhang, Giuseppe Scardera, David Payne, Malcolm Abbott, Bram Hoex

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

1 Citation (Scopus)

Abstract

A considerable amount of literature has revealed the effectiveness of surface passivation by charge carrier population control either using dopant profiles or charged dielectrics. Most studies assume that the substrate thickness is far larger than the space charge region. However, this assumption does not hold for nano-structured surfaces such as black silicon. In this work, we use one-dimensional modeling to understand the effect of nano-features on charge carrier population control by dielectric fixed charge Qf. We find that when Qf is smaller than ∼1×1011 cm−2, the decreasing two-surface distance will effectively compress the space charge region and intensify the surface carrier asymmetry, which can be considered as an enhancement of charge carrier population control for surface passivation. Nevertheless, when the Qf magnitude is larger than ∼1×1011 cm−2, the mirrored charge tends to concentrate at the near-surface region, and the space charge region compression is less effective. This leads to a reduced influence on the charge carrier population control and consequently little enhanced surface passivation.
Original languageEnglish
Title of host publication2020 47th IEEE Photovoltaic Specialists Conference (PVSC)
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages590-594
Number of pages5
ISBN (Electronic)9781728161150
ISBN (Print)9781728161167
DOIs
Publication statusPublished - 2020
Event47th IEEE Photovoltaic Specialists Conference, PVSC 2020 - Calgary, Canada
Duration: 15 Jun 202021 Aug 2020

Publication series

Name
ISSN (Print)0160-8371

Conference

Conference47th IEEE Photovoltaic Specialists Conference, PVSC 2020
CountryCanada
CityCalgary
Period15/06/2021/08/20

Keywords

  • field-effect passivation
  • charge carrier population control
  • black silicon

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