Understanding field-effect passivation of black silicon: modeling charge carrier population control in compressed space charge regions

Shaozhou Wang, Xinyuan Wu, Fajun Ma, Yu Zhang, Giuseppe Scardera, David Payne, Malcolm Abbott, Bram Hoex

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

1 Citation (Scopus)

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Engineering & Materials Science