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Understanding micro and atomic structures of secondary phases in Cu-doped SnTe

Youichirou Kawami*, Xuan Quy Tran, Kohei Aso, Tomokazu Yamamoto, Yuan Wang, Meng Li, Anya Yago, Syo Matsumura, Kazuhiro Nogita, Jin Zou

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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Abstract

Highly efficient thermoelectric materials require, including point defects within the host matrix, secondary phases generating positive effects on lowering lattice thermal conductivity (κL). Amongst effective dopants for a functional thermoelectric material, SnTe, Cu doping realizes the ultra-low κL approaching the SnTe amorphous limit. Such effective κL reduction is first attributed to strong phonon scattering by substitutional Cu atoms at Sn sites and interstitial defects in the host SnTe. However, other crystallographic defects in secondary phases have been unfocused. Here, this work reports micro- to atomic-scale characterization on secondary phases of Cu-doped SnTe using advanced microscopes. It is found that Cu-rich secondary phases begin precipitation ≈1.7 at% Cu (x = 0.034 where Sn1−xCuxTe). The Cu-rich secondary phases encapsulate two distinct solids: Cu2SnTe3 (F4‾3m) has semi-coherent interfaces with SnTe (Fm3‾m) such that they minimize lattice mismatch to favor the thermoelectric transport; the other resembles a stoichiometric Cu2Te model, yet is so meta-stable that it demonstrates not only various defects such as dislocation cores and ordered/disordered Cu vacancies, but also dynamic grain-boundary migration with heating and a subsequent phase transition ≈350 °C. The atomic-scale analysis on the Cu-rich secondary phases offers viable strategies for reducing κL through Cu addition to SnTe.

Original languageEnglish
Article number2204225
Pages (from-to)1-12
Number of pages12
JournalSmall
Volume18
Issue number42
DOIs
Publication statusPublished - 20 Oct 2022
Externally publishedYes

Bibliographical note

Copyright the Author(s) 2022. Version archived for private and non-commercial use with the permission of the author/s and according to publisher conditions. For further rights please contact the publisher.

Keywords

  • Cs-corrected scanning transmission electron microscopy
  • lattice thermal conductivity
  • secondary phase
  • thermoelectricity

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