Use of instantaneous frequency measurement to determine the injection current range giving valid Relaxation Oscillation Frequency values in quantum well lasers

C. J. McMahon; D. M. Kane

doi:10.1109/ICONN.2010.6045198

Use of instantaneous frequency measurement to determine the injection current range giving valid Relaxation Oscillation Frequency values in quantum well lasers

C. J. McMahon^*, D. M. Kane

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

Abstract

Relaxation Oscillation Frequency (ROF) as a function of current is a key parameter of quantum well lasers. Here we apply a new technique to study the ROF at high injection currents where ROFs are very heavily damped.

Original language	English
Title of host publication	ICONN 2010 - Proceedings of the 2010 International Conference on Nanoscience and Nanotechnology
Editors	Andrew Dzurak
Place of Publication	Piscataway, NJ
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	348-350
Number of pages	3
ISBN (Print)	9781424452620
DOIs	https://doi.org/10.1109/ICONN.2010.6045198
Publication status	Published - 2010
Event	2010 3rd International Conference on Nanoscience and Nanotechnology, ICONN - 2010 - Sydney, Australia Duration: 22 Feb 2010 → 26 Feb 2010

Other

Other	2010 3rd International Conference on Nanoscience and Nanotechnology, ICONN - 2010
Country/Territory	Australia
City	Sydney
Period	22/02/10 → 26/02/10

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McMahon, C. J., & Kane, D. M. (2010). Use of instantaneous frequency measurement to determine the injection current range giving valid Relaxation Oscillation Frequency values in quantum well lasers. In A. Dzurak (Ed.), ICONN 2010 - Proceedings of the 2010 International Conference on Nanoscience and Nanotechnology (pp. 348-350). [6045198] Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/ICONN.2010.6045198

McMahon, C. J. ; Kane, D. M. / Use of instantaneous frequency measurement to determine the injection current range giving valid Relaxation Oscillation Frequency values in quantum well lasers. ICONN 2010 - Proceedings of the 2010 International Conference on Nanoscience and Nanotechnology. editor / Andrew Dzurak. Piscataway, NJ : Institute of Electrical and Electronics Engineers (IEEE), 2010. pp. 348-350

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title = "Use of instantaneous frequency measurement to determine the injection current range giving valid Relaxation Oscillation Frequency values in quantum well lasers",

abstract = "Relaxation Oscillation Frequency (ROF) as a function of current is a key parameter of quantum well lasers. Here we apply a new technique to study the ROF at high injection currents where ROFs are very heavily damped.",

author = "McMahon, {C. J.} and Kane, {D. M.}",

year = "2010",

doi = "10.1109/ICONN.2010.6045198",

language = "English",

isbn = "9781424452620",

pages = "348--350",

editor = "Andrew Dzurak",

booktitle = "ICONN 2010 - Proceedings of the 2010 International Conference on Nanoscience and Nanotechnology",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

note = "2010 3rd International Conference on Nanoscience and Nanotechnology, ICONN - 2010 ; Conference date: 22-02-2010 Through 26-02-2010",

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McMahon, CJ & Kane, DM 2010, Use of instantaneous frequency measurement to determine the injection current range giving valid Relaxation Oscillation Frequency values in quantum well lasers. in A Dzurak (ed.), ICONN 2010 - Proceedings of the 2010 International Conference on Nanoscience and Nanotechnology., 6045198, Institute of Electrical and Electronics Engineers (IEEE), Piscataway, NJ, pp. 348-350, 2010 3rd International Conference on Nanoscience and Nanotechnology, ICONN - 2010, Sydney, New South Wales, Australia, 22/02/10. https://doi.org/10.1109/ICONN.2010.6045198

Use of instantaneous frequency measurement to determine the injection current range giving valid Relaxation Oscillation Frequency values in quantum well lasers. / McMahon, C. J.; Kane, D. M.

ICONN 2010 - Proceedings of the 2010 International Conference on Nanoscience and Nanotechnology. ed. / Andrew Dzurak. Piscataway, NJ : Institute of Electrical and Electronics Engineers (IEEE), 2010. p. 348-350 6045198.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

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T1 - Use of instantaneous frequency measurement to determine the injection current range giving valid Relaxation Oscillation Frequency values in quantum well lasers

AU - McMahon, C. J.

AU - Kane, D. M.

PY - 2010

Y1 - 2010

N2 - Relaxation Oscillation Frequency (ROF) as a function of current is a key parameter of quantum well lasers. Here we apply a new technique to study the ROF at high injection currents where ROFs are very heavily damped.

AB - Relaxation Oscillation Frequency (ROF) as a function of current is a key parameter of quantum well lasers. Here we apply a new technique to study the ROF at high injection currents where ROFs are very heavily damped.

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DO - 10.1109/ICONN.2010.6045198

M3 - Conference proceeding contribution

AN - SCOPUS:80555143021

SN - 9781424452620

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EP - 350

BT - ICONN 2010 - Proceedings of the 2010 International Conference on Nanoscience and Nanotechnology

A2 - Dzurak, Andrew

PB - Institute of Electrical and Electronics Engineers (IEEE)

CY - Piscataway, NJ

T2 - 2010 3rd International Conference on Nanoscience and Nanotechnology, ICONN - 2010

Y2 - 22 February 2010 through 26 February 2010

ER -

McMahon CJ, Kane DM. Use of instantaneous frequency measurement to determine the injection current range giving valid Relaxation Oscillation Frequency values in quantum well lasers. In Dzurak A, editor, ICONN 2010 - Proceedings of the 2010 International Conference on Nanoscience and Nanotechnology. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE). 2010. p. 348-350. 6045198 https://doi.org/10.1109/ICONN.2010.6045198

Use of instantaneous frequency measurement to determine the injection current range giving valid Relaxation Oscillation Frequency values in quantum well lasers

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