Whole-genome comparison reveals novel genetic elements that characterize the genome of industrial strains of Saccharomyces cerevisiae

Anthony R. Borneman*, Brian A. Desany, David Riches, Jason P. Affourtit, Angus H. Forgan, Isak S. Pretorius, Michael Egholm, Paul J. Chambers

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingChapter

1 Citation (Scopus)
Original languageEnglish
Title of host publicationInvestigations in yeast functional genomics and molecular biology
EditorsMatthew Eckwahl
Place of PublicationToronto
PublisherApple Academic Press
Pages339-362
Number of pages24
ISBN (Electronic)9781482240962
ISBN (Print)9781771880107
DOIs
Publication statusPublished - 2014
Externally publishedYes

Bibliographical note

This chapter originally published under the Creative Commons Attribution License. Borneman AR, Desany BA, Riches D, Affourtit JP, Forgan AH, Pretorius IS, Egholm M, and Chambers PJ. Whole-Genome Comparison Reveals Novel Genetic Elements That Characterize the Genome of Industrial Strains of Saccharomyces cerevisiae. PLoS Genetics 7,2 (2011). DOI:10.1371/journal.pgen.1001287

Cite this

Borneman, A. R., Desany, B. A., Riches, D., Affourtit, J. P., Forgan, A. H., Pretorius, I. S., ... Chambers, P. J. (2014). Whole-genome comparison reveals novel genetic elements that characterize the genome of industrial strains of Saccharomyces cerevisiae. In M. Eckwahl (Ed.), Investigations in yeast functional genomics and molecular biology (pp. 339-362). Toronto: Apple Academic Press. https://doi.org/10.1201/b16586