Worst case scenario for large distribution networks with distributed generation

M. A. Mahmud*, M. J. Hossain, H. R. Pota

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

13 Citations (Scopus)

Abstract

Integration of distributed generation (DG) in distribution network has significant effects on voltage profile for both customers and distribution network service providers (DNSPs). This impact may manifest itself positively or negatively, depending on variation of the voltage and the amount of DG that can be connected to the distribution networks. This paper presents a way to estimate the voltage variation and the amount of the DG that can be accommodated into the distribution networks. To do this, a voltage rise formula is used with some approximation and the validation of this formula is checked by comparing with the existing power systems simulation software. Using the voltage variation formula, the worst case scenario of the distribution network with DG is used to estimate the amount of voltage variation and maximum permissible DG.

Original languageEnglish
Title of host publicationPESGM 2011
Subtitle of host publicationIEEE Power and Energy Society General Meeting: proceedings
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1-7
Number of pages7
ISBN (Electronic)9781457710018, 9781457710025
ISBN (Print)9781457710001
DOIs
Publication statusPublished - 2011
Externally publishedYes
EventIEEE Power and Energy Society General Meeting, PESGM 2011 - Detroit, MI, United States
Duration: 24 Jul 201129 Jul 2011

Conference

ConferenceIEEE Power and Energy Society General Meeting, PESGM 2011
CountryUnited States
CityDetroit, MI
Period24/07/1129/07/11

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  • Cite this

    Mahmud, M. A., Hossain, M. J., & Pota, H. R. (2011). Worst case scenario for large distribution networks with distributed generation. In PESGM 2011: IEEE Power and Energy Society General Meeting: proceedings (pp. 1-7). Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/PES.2011.6039303