X-ray photoelectron spectroscopy characterization of radio frequency reactively sputtered carbon nitride thin films

Sunil Kumar*, K. S. A. Butcher, T. L. Tansley

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

56 Citations (Scopus)

Fingerprint

Dive into the research topics of 'X-ray photoelectron spectroscopy characterization of radio frequency reactively sputtered carbon nitride thin films'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science

Physics & Astronomy